variable-pressure scanning electron microscope (vp-sem Search Results


variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
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s-2600n variable pressure scanning electron microscope (vpsem  (Hitachi Ltd)
90
Hitachi Ltd s-2600n variable pressure scanning electron microscope (vpsem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S 2600n Variable Pressure Scanning Electron Microscope (Vpsem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-2600n variable pressure scanning electron microscope (vpsem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s-2600n variable pressure scanning electron microscope (vpsem - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier
s 4300se/n variable pressure scanning electron microscope (vp sem  (Hitachi Ltd)
90
Hitachi Ltd s 4300se/n variable pressure scanning electron microscope (vp sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S 4300se/N Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s 4300se/n variable pressure scanning electron microscope (vp sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s 4300se/n variable pressure scanning electron microscope (vp sem - by Bioz Stars, 2026-03
90/100 stars
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su1510 variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd su1510 variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Su1510 Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/su1510 variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
su1510 variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier
variable-pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable-pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier
variable pressure scanning electron microscope (vp-sem) s-3400n  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem) s-3400n
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem) S 3400n, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem) s-3400n/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem) s-3400n - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier
s-3600n variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd s-3600n variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S 3600n Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-3600n variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s-3600n variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier
s3500n variable-pressure scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd s3500n variable-pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S3500n Variable Pressure Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s3500n variable-pressure scanning electron microscope/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s3500n variable-pressure scanning electron microscope - by Bioz Stars, 2026-03
90/100 stars
  Buy from Supplier

Image Search Results


Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Journal: Plants

Article Title: Antioxidant Responses of Phenolic Compounds and Immobilization of Copper in Imperata cylindrica , a Plant with Potential Use for Bioremediation of Cu Contaminated Environments

doi: 10.3390/plants9101397

Figure Lengend Snippet: Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Article Snippet: In order to localize the Cu-bound to the shoot and root tissues, plants with 21 days of growth were observed by Variable Pressure Scanning Electron Microscope (VP-SEM), with transmission module STEM SU-3500 (Hitachi, Tokyo, Japan).

Techniques: Electron Microscopy